Metalenses consist of a large number of optical nanoantennas which are capable of focusing the incoming wavefront of light. We use a 60 × 60 dielectric achromatic metalens array to capture multidimensional optical information. The highest efficiency can be up to 74% at a wavelength of 420 nm, while the average efficiency is approximately 39% over the whole working bandwidth. The light field images and the depth information of objects can be determined by reorganizing the patches of sub-images and calculating the disparity of neighbor sub-images, respectively. The depth information can be used to optimize the patch sizes to render the all-in-focus images without artifacts. The smallest feature of objects that could be resolved in our system is 1.95 μm under the incoherent white light. Our work provides several advantages associated with light field imaging: elimination of chromatic aberration, polarization selectivity and compatibility of the semiconductor process. Considering the flexibility, the achromatic multiplexed metalens array with integrated functionalities may be promising for multifocusing microscopy, high-dimension quantum technology, hyperspectral microscopy, micro robotic vision, nomen automobile sensing, virtual and augmented reality (VR and AR), drones, and miniature personal security systems.
Professor Din Ping Tsai is a Distinguished Professor of National Taiwan University. He is a Fellow of AAAS, APS, IEEE, JSAP, OSA, SPIE and Electro Magnetics Academy. He is also Academician of Asia Pacific Academy of Materials, and Member of International Academy of Engineering (IAE). He serves as an Editor of “Progress in Quantum Electronics”, an Associate Editor of “Journal of Lightwave Technology”, and a Member of Editorial Boards of “ACS photonics”, “Advanced Quantum Technologies”, “APL Photonics”, “Optics Communications”, “Opto-Electronic Advances”, “Optoelectronics Letters”, “Plasmonics”, “Physical Review Applied” and “Small Method”, respectively. He was the President of Taiwan Photonics Society (TPS); Director of the Board of SPIE; Member of OSA Fellow Honorary Committee; SPIE Fellow Committee; Member of IEEE I&M Fellow Committee; IEEE Joseph F. Keithley Award Committee; OSA and IS&T Edwin H. Land Medal Committee; respectively.