Pinpoint Chemistry and Function at Nano and Atomic Scales– New AFM Capabilities for Materials Research

Today’s materials science and engineering are highly multidisciplinary. This poses grand challenges in materials characterization, in particular, on the nano and atomic scales. Seeing atoms and nanostructures on material surfaces in situ for in operando studies under controlled ambience is a unique capability of atomic force microscopy (AFM). However, pure topographic information is generally insufficient in deciphering the functionality of materials. Fortunately, the cutting-edge AFM approaches today can provide multidimensional information so that one can explore the basic principles underlying functionality by correlating chemical information with physical properties and morphological structures. In this talk, I will cover new AFM capabilities based on the new PeakForce Tapping mode in characterizing materials beyond topography, including mechanical properties, electronic structures, electrochemical reactivities, and optical characteristics. Examples shown in my talk include 1D and 2D materials, thin films, 3D structures and energy devices.